In the region where time stability is good, regardless of the growth stage, the leaf area analyzer consistently raises the average leaf area index and coverage for some samples, while others remain consistently lower than the mean. A few samples stay equal to or close to the average leaf area index and coverage of the study area. These represent stable measurement points that are representative of the overall area.
The leaf area analyzer's measurement points are key for data collection. By analyzing these points, it becomes much easier to determine the average leaf area index and coverage of the entire study area, significantly streamlining the process.
If the spring wheat’s leaf area index and coverage show temporal stability at certain locations within the test area, those locations can serve as ground sampling points for long-term localized experiments. The rank factor is often used to identify whether a position exhibits time stability. Spring wheat’s leaf area index and coverage display time-stable characteristics across different growth stages.
When dealing with continuous observation data on leaf area index and coverage, calculating variance may lead to significant errors. To address this, the average relative error and range are used as criteria to assess time stability during the growth period. The average relative error of each sample’s leaf area index (or coverage) can reflect how well the sample position represents the overall study area.
A positive value measured by the leaf area analyzer indicates that the sample has a higher leaf area index (or coverage) than the study area’s average, while a negative value suggests it is lower. However, a small number of samples remain consistently equal to or very close to the average. The extreme difference represents the average relative error of the leaf area index (or coverage) over the entire growth period, offering insight into the stability of measurements across time.
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