Leaf area analyzer for stability analysis of spring wheat at different stages - Database & Sql Blog Articles

    In the region where time stability is good, regardless of the growth stage, the leaf area analyzer consistently captures higher average leaf area index and coverage for some samples, while others remain consistently lower than the mean. A few samples remain equal to or very close to the average values of the study area. These samples reflect stable and representative measurements. The measurement points selected by the leaf area analyzer are reliable and can be used to quickly determine the overall average leaf area index and coverage of the entire study area, significantly streamlining the data collection process. Assuming that the leaf area index and coverage of spring wheat exhibit temporal stability at specific locations within the test area of the leaf area analyzer, these sites can serve as long-term ground sampling points for localized experiments in the study area. The rank factor is first applied to identify time-stable positions. It has been observed that the leaf area index and coverage of spring wheat demonstrate time-stability characteristics across different growth stages. When analyzing continuous observation data of leaf area index and coverage, calculating variance may lead to significant errors. To address this, the average relative error and the range are used as key criteria to assess the time stability of the leaf area index and coverage throughout the growing period. The average relative error for each sample provides an indication of how well the sample’s position represents the overall average of the study area. A positive value measured by the leaf area analyzer indicates that the sample’s leaf area index (or coverage) is higher than the average of the study area, whereas a negative value suggests it is lower. However, a small number of samples consistently remain equal to or very close to the average leaf area index and coverage of the study area. The extreme difference represents the average relative error of the leaf area index (or coverage) over the entire growth cycle, highlighting the variability and consistency of the measurements.

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